• DocumentCode
    108498
  • Title

    Effects of Triboelectrostatic Charging Between Polymer Surfaces in Manufacturing and Test of Integrated Circuit Packages

  • Author

    Panat, Rahul ; Jinlin Wang ; Parks, Edward

  • Author_Institution
    Assembly & Test Technol. Dev., Intel Corp., Chandler, AZ, USA
  • Volume
    4
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    943
  • Lastpage
    946
  • Abstract
    Integrated circuit (IC) package assembly and test processes include several industrial steps involving physical contact and/or friction between polymer surfaces of handlers and packages. The trend toward smaller and sleeker gadgets has resulted in a dramatic reduction in the package weight due to thickness and size miniaturization. In this paper, we show that the forces created through triboelectrostatic charging between surfaces of handlers and packages are comparable with the weight of thin and small IC packages. Furthermore, the voltages generated in such triboelectric interactions are rather small - typically below the concern levels set in the IC industry. The results show that for IC packages with a subgram weight, the impact of the triboelectrostatic force on the assembly processes is significant and occurs at low static voltages <;200 V. The data presented in this paper provides valuable insights into the selection of materials for handler designs in contact with IC packages during assembly and test processes.
  • Keywords
    integrated circuit packaging; polymers; surface charging; testing; IC industry; IC package assembly; assembly processes; integrated circuit package assembly; polymer surfaces; test processes; triboelectrostatic charging effects; triboelectrostatic force; Assembly; Industries; Integrated circuits; Polymers; Silicon; Surface treatment; Assembly; electrostatic charging; friction; integrated circuit; triboelectricity;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2014.2303985
  • Filename
    6746022