• DocumentCode
    1085281
  • Title

    Improvement of kink-free output power by using highly resistive regions in both sides of the ridge stripe for 980-nm laser diodes

  • Author

    Yuda, Masahiro ; Hirono, Takuo ; Kozen, Atsuo ; Amano, Chikara

  • Author_Institution
    NTT Photonics Labs., NTT Corp., Kanagawa, Japan
  • Volume
    40
  • Issue
    9
  • fYear
    2004
  • Firstpage
    1203
  • Lastpage
    1207
  • Abstract
    Suppressing the lateral expansion of driving current by forming highly resistive regions at both sides of the ridge stripe in ridge-waveguide-type 980-nm laser diodes leads to an enhanced kink-free output power. The highly resistive regions are formed by hydrogen passivation of p-type carrier (Zn) on the plasma exposure in a mixture gas of methane and hydrogen. A simulation predicted a decrease in local gain in the lateral direction at both sides of the ridge stripe. Fabricated laser diodes with the highly resistive regions exhibit kink-free output power of over 500 mW, showing an increase in kink-free power of 85 mW on average with an increase of slope efficiency of about 10% compared to those without highly resistive regions.
  • Keywords
    optical fabrication; optical fibre amplifiers; passivation; quantum well lasers; ridge waveguides; waveguide lasers; 500 mW; 85 mW; 980 nm; H; driving current; highly resistive regions; hydrogen passivation; kink-free output power; laser diode fabrication; laser diodes; lateral expansion; local gain; methane; optical fiber amplifiers; p-type carrier; plasma exposure; quantum-well lasers; ridge stripe; ridge waveguide; semiconductor lasers; Diode lasers; Hydrogen; Optical fiber communication; Optical pumping; Optical refraction; Optical variables control; Optical waveguides; Passivation; Power generation; Stimulated emission; Optical fiber amplifiers; quantum-well lasers; ridge waveguides; semiconductor lasers; semiconductor quantum wells;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2004.833218
  • Filename
    1327769