Title :
Strongly Diagnosable Product Networks Under the Comparison Diagnosis Model
Author :
Hsieh, Sun-Yuan ; Chen, Yu-Shu
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan
fDate :
6/1/2008 12:00:00 AM
Abstract :
The notion of diagnosability has long played an important role in measuring the reliability of multiprocessor systems. Such a system is t-diagnosable if all faulty nodes can be identified without replacement when the number of faults does not exceed t, where t is some positive integer. Furthermore, a system is strongly i-diagnosable if it can achieve (t + 1)-diagnosability, except for the case where a node´s neighbors are all faulty. In this paper, we investigate the strong diagnosability of a class of product networks, under the comparison diagnosis model. Based on our results, we can determine the strong diagnosability of several widely used multiprocessor systems, such as hypercubes, mesh-connected k-ary n-cubes, torus-connected k-ary n-cubes, and hyper-Petersen networks.
Keywords :
fault diagnosis; graph theory; multiprocessor interconnection networks; network theory (graphs); network topology; reliability; fault diagnosis; graph Cartesian product operation to; multiprocessor interconnection network; multiprocessor system reliability; network topology; strongly diagnosable product network; t-diagnosable system; Computer Society; Computer network reliability; Fault diagnosis; Graph theory; Hypercubes; Multiprocessing systems; Multiprocessor interconnection networks; Network topology; Testing; Very large scale integration; Discrete Mathematics; Fault tolerance; Graph Theory; Mathematics of Computing; Measurement; Network problems; On-chip interconnection networks; Reliability; Testing; and Fault-Tolerance; evaluation; modeling; simulation of multiple-processor systems;
Journal_Title :
Computers, IEEE Transactions on