Title :
Reduced invasiveness of noncontact electrooptic probes in millimeter-wave optoelectronic characterization
Author :
Zeng, A. ; Shah, S.A. ; Jackson, M.K.
Author_Institution :
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
fDate :
7/1/1996 12:00:00 AM
Abstract :
We report time-resolved measurements of the invasiveness of LiTaO 3 external probes in millimeter-wave electrooptic sampling. Using external probe tips at varying distances from a coplanar stripline, we show that invasiveness can be reduced in a noncontact configuration at the expense of measurement sensitivity. In the contact configuration, the risetime can be significantly lengthened by dispersion and signal reflection caused by the probe tip
Keywords :
electro-optical devices; integrated circuit measurement; integrated optoelectronics; lithium compounds; millimetre wave integrated circuits; millimetre wave measurement; probes; signal sampling; time resolved spectroscopy; LiTaO3; contact configuration; coplanar stripline; dispersion; external probes; measurement sensitivity; millimeter-wave electrooptic sampling; millimeter-wave optoelectronic characterization; noncontact configuration; noncontact electrooptic probes; probe tip; signal reflection; time-resolved measurements; Contacts; Electrodes; Millimeter wave measurements; Photoconductivity; Probes; Reflection; Sampling methods; Stripline; Switches; Transmission line measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
