Title :
Contrast studies in high-performance projection optics
Author :
Oldham, William G. ; Arden, Wolfgang ; Binder, Hans ; Ting, C.
Author_Institution :
University of California, Berkeley, CA
fDate :
11/1/1983 12:00:00 AM
Abstract :
Image contrast is a simple physical parameter for estimating performance Of optical systems using positive photoresist. Measurements of image contrast are reported on a variety of single and multi-wavelength projection aligners, and compared with theoretical predictions. On the best systems the dark field contrast approaches the theoretical (diffraction limited) contrast within an equivalent defocus error of about one-half Rayleigh unit. In general the contrast is lower, owing to a number of nonidealities. The effects of focus error, astigmatism, chromatic aberration, off-axis aberrations, and flare from clear-field areas are observed in the contrast measurements. On some systems, the contrast can be significantly increased by a modification of the source filtering.
Keywords :
Area measurement; Filling; Focusing; Frequency; Lenses; Lighting; Optical diffraction; Optical filters; Optical sensors; Resists;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21326