Title :
Alternative built-in self-test (BIST) structures for analogue circuit fault diagnosis
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
To increase the number of test points, while still keeping low pint overhead, an alternative built-in self-test (BIST) structure using current copiers is presented. The BIST structure allows simultaneous sampling of either voltage or current test data at various test points and shifting the data for fault diagnosis and testing.
Keywords :
VLSI; built-in self test; insulated gate field effect transistors; integrated circuit technology; integrated circuit testing; linear integrated circuits; BIST; BIST structure; analogue circuit fault diagnosis; built-in self-test; current copiers; current test data; fault diagnosis; low pint overhead; number of test points; simultaneous sampling; voltage test data;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19911017
