DocumentCode

1087763

Title

IIIB-4 analysis on selective writing for Taper isolated RAM cell

Author

Kurosawa, Shunsuke ; Ishijima, Tatsuo ; Takada, Masumi ; Terada, Kenji ; Suzuki, Satoshi

Volume

30

Issue

11

fYear

1983

fDate

11/1/1983 12:00:00 AM

Firstpage

1582

Lastpage

1582

Keywords

Analytical models; Boron; Impurities; Laboratories; MOSFET circuits; Microelectronics; Performance analysis; Testing; Thyristors; Writing;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1983.21368

Filename

1483269