Title :
VB-3 stacked CMOS sRAM cell
Author :
Chen, Chiao-En ; Lam, H.W. ; Malhi, S.D.S. ; Pinizzotto, R.F.
fDate :
11/1/1983 12:00:00 AM
Keywords :
Bipolar transistors; CMOS process; CMOS technology; Circuit testing; Instruments; Inverters; Isolation technology; MOS devices; Resistors; Silicon on insulator technology;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21399
