DocumentCode
1088577
Title
New GaAs n+-p- delta (n+)-i- delta (p+)-i-n+ switching device grown by molecular beam epitaxy
Author
Liu, Wei-Chang ; Sun, C.-Y.
Author_Institution
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
Volume
27
Issue
19
fYear
1991
Firstpage
1704
Lastpage
1706
Abstract
A new GaAs switching device with an n+-p- delta (n+)-i- delta (p+)-i-n+ structure has been demonstrated. An interesting S-shaped negative differential resistance (NDR) is shown to occur that originates from the avalanche multiplications within the delta (n+)-i- delta (p+)-i sawtooth doped superlattice (SDS). The excellent NDR behaviour gives the studied structure good potential for switching device applications. Furthermore, with an adequate design, the studied structure can be applied to fabricate a new functional device.
Keywords
III-V semiconductors; gallium arsenide; impact ionisation; molecular beam epitaxial growth; negative resistance effects; semiconductor epitaxial layers; semiconductor superlattices; semiconductor switches; GaAs; S-shaped negative differential resistance; avalanche multiplications; functional device; molecular beam epitaxy; n +-p- delta (n +)-i- delta (p +)-i-n + structure; sawtooth doped superlattice; switching device;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19911061
Filename
132945
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