• DocumentCode
    1088577
  • Title

    New GaAs n+-p- delta (n+)-i- delta (p+)-i-n+ switching device grown by molecular beam epitaxy

  • Author

    Liu, Wei-Chang ; Sun, C.-Y.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
  • Volume
    27
  • Issue
    19
  • fYear
    1991
  • Firstpage
    1704
  • Lastpage
    1706
  • Abstract
    A new GaAs switching device with an n+-p- delta (n+)-i- delta (p+)-i-n+ structure has been demonstrated. An interesting S-shaped negative differential resistance (NDR) is shown to occur that originates from the avalanche multiplications within the delta (n+)-i- delta (p+)-i sawtooth doped superlattice (SDS). The excellent NDR behaviour gives the studied structure good potential for switching device applications. Furthermore, with an adequate design, the studied structure can be applied to fabricate a new functional device.
  • Keywords
    III-V semiconductors; gallium arsenide; impact ionisation; molecular beam epitaxial growth; negative resistance effects; semiconductor epitaxial layers; semiconductor superlattices; semiconductor switches; GaAs; S-shaped negative differential resistance; avalanche multiplications; functional device; molecular beam epitaxy; n +-p- delta (n +)-i- delta (p +)-i-n + structure; sawtooth doped superlattice; switching device;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911061
  • Filename
    132945