Title :
The COMFET—A new high conductance MOS-gated device
Author :
Russell, J.P. ; Goodman, A.M. ; Goodman, L.A. ; Neilson, J.M.
Author_Institution :
RCA Laboratories, Princeton, NJ
fDate :
3/1/1983 12:00:00 AM
Abstract :
A new MOS gate-controlled power switch with a very low on-resistance is described. The fabrication process is similar to that of an n-channel power MOSFET but employs an n--epitaxial layer grown on a p+substrate. In operation, the epitaxial region is conductivity modulated (by excess holes and electrons) thereby eliminating a major component of the on-resistance. For example, on-resistance values have been reduced by a factor of about 10 compared with those of conventional n-channel power MOSFET´s of comparable size and voltage capability.
Keywords :
Anodes; Charge carrier processes; Conductivity; Fabrication; Latches; MOSFET circuits; Power MOSFET; Substrates; Thyristors; Voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1983.25649