• DocumentCode
    1089529
  • Title

    Charge and Velocity Distribution of Ions Emitted From Two Simultaneously Operating and Serially Connected Vacuum Arcs

  • Author

    Shafir, Guy ; Goldsmith, Samuel ; Cheifetz, Eli

  • Author_Institution
    Tel Aviv Univ., Tel Aviv
  • Volume
    35
  • Issue
    4
  • fYear
    2007
  • Firstpage
    885
  • Lastpage
    890
  • Abstract
    Ion velocity distribution (IVD) and ion charge state distribution of silver ions in a plasma beam emitted by two compact, serially connected, and simultaneously operating vacuum arcs were measured using a dynamic time-of-flight diagnostics. The anode and cathode of each arc were made of two strips of silver layers pasted on an alumina wafer and separated by a narrow 100-mum gap. The two arcs were laterally separated by 0.015 m and located on the same horizontal plane, emitting two plasma plums, which merged into a single one and is few centimeters away from the arcs. Each arc was ignited by high- voltage breakdown on the alumina surface gap by 3-mus 100-A current. The IVD of the merged plasma beam was analyzed 0.7 m away from the arcs and compared with that of the ions emitted by a single arc. When only a single arc was active, the plasma beam consisted of more than 90% of Ag ions with an average velocity of langv1rang = (0.7-0.8) times 104 m/s and charge state z = 1. About 10% of the beam ion population consisted of oxygen and carbon. When the two arcs operated simultaneously, the form of the IVD was significantly different, containing a second peak with a velocity of langvpeakrang = (1.15-1.25) times 104 m/s, which is significantly higher than that observed with a single arc. However, the integrated ion charge in the merged beam was lower by 30% from the sum of the ion charge obtained from the plasma of each arc. It was found that the observed phenomena were correlated with a formation of conducting channel between the cathode of the first serially connected arc and the anode of the second arc, which is occurring when the plasma plums are expanding from the two arcs merged. When a physical barrier was inserted between the two arcs to prevent a contact between the two expanding plums, the observed plasma shunting did not occur, although the two beams merged in space beyond the barrier, as before. The effect on the IVD due to arc tra- nsfer from the first cathode to the second arc anode is currently being investigated.
  • Keywords
    cathodes; plasma diagnostics; silver; time of flight mass spectra; vacuum arcs; Ag - Element; alumina wafer; arc anode; arc cathode; arc transfer; conducting channel formation; current 100 A; distance 0.015 m; distance 0.7 m; distance 100 mum; dynamic time of flight diagnostics; integrated ion charge; ion charge state distribution; ion velocity distribution; plasma beam; plasma plums expansion; plasma shunting; serially connected vacuum arcs; silver ions; time 3 mus; vacuum arc ion emission; velocity 11500 m/s to 12500 m/s; velocity 7000 m/s to 8000 m/s; Anodes; Cathodes; Charge measurement; Current measurement; Particle beam measurements; Particle beams; Plasma diagnostics; Plasma measurements; Silver; Vacuum arcs; Ion charge state distribution (ICSD); ion energy distribution (IED); silver; time-of-flight (TOF) measurements; vacuum arcs;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2007.901919
  • Filename
    4287081