DocumentCode :
1089915
Title :
Stacked CMOS SRAM cell
Author :
Chen, C.E. ; Lam, H.W. ; Malhi, S.D.S. ; Pinizzotto, R.F.
Author_Institution :
Texas Instruments, Inc., Dallas, TX
Volume :
4
Issue :
8
fYear :
1983
fDate :
8/1/1983 12:00:00 AM
Firstpage :
272
Lastpage :
274
Abstract :
A static random access memory (SRAM) cell with cross-coupled stacked CMOS inverters is demonstrated for the first time. In this approach, CMOS inverters are fabricated with a laser recrystallized p-channel device stacked on top of and sharing the gate with a bulk n-channel device using a modified two-polysilicon n-MOS process. The memory cell has been exercised through the write and read cycles with external signal generators while the output is buffered by an on-chip, stacked-CMOS-inverter-based amplifier.
Keywords :
Circuit testing; Coatings; Etching; Laser modes; MOS devices; Power lasers; Random access memory; Silicon; Thermal stresses; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1983.25730
Filename :
1483474
Link To Document :
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