• DocumentCode
    1091303
  • Title

    Optical fiber and preform profiling technology

  • Author

    Stewart, W.J.

  • Author_Institution
    Plessey Research (Caswell) Limited, Allen Clark Research Centre, Caswell, Towcester, England
  • Volume
    18
  • Issue
    10
  • fYear
    1982
  • fDate
    10/1/1982 12:00:00 AM
  • Firstpage
    1451
  • Lastpage
    1466
  • Abstract
    A comprehensive review of state-of-the-art optical fiber and preform index-profiling methods has been prepared. The advantages and disadvantages of the various approaches are discussed. Important parameters include measurement accuracy, resolution, simplicity, and the nondestructive features of some methods. Both optical and nonoptical techniques have been treated. Resolution considerations probably favor the refracted near-field technique and this may be a decisive factor for the measurement of single-mode fibers. Simplicity of apparatus lies with near-field methods generally so that the bound near-field method is most often used for dimensional measurements. Preform profiling is dominated by deflection function methods, usually accompanied by spatial filtering or focusing. Methods restricted to certain classes of fiber, such as the far-field approaches, are less attractive and, consequently, do not receive as much use.
  • Keywords
    Bibliographies; Optical fiber measurements; Optical refraction; Bandwidth; Length measurement; Optical attenuators; Optical fibers; Optical filters; Optical refraction; Preforms; Refractive index; Shape; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1982.1071398
  • Filename
    1071398