• DocumentCode
    1091997
  • Title

    Breakdown and Voltage–Time Characteristics of Turn-to-Turn Models for an HTS Transformer

  • Author

    Baek, Seung Myeong ; Kim, Sang Hyun

  • Author_Institution
    Changwon Coll., Changwon
  • Volume
    18
  • Issue
    1
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    36
  • Lastpage
    41
  • Abstract
    The breakdown and voltage-time characteristics of turn-to-turn models for point contact geometry and surface contact geometry using copper multiwrapped with polyimide film for a high-temperature superconducting transformer were investigated under ac and impulse voltage at 77 K. Polyimide film (Kapton) 0.025 mm thick is used for multiwrapping of the electrode. As expected, the breakdown voltages for the surface contact geometry are lower than that of the point contact geometry, because the contact area of the surface contact geometry is lager than that of the point contact geometry. The time to breakdown t 50decreases as the applied voltage is increased, and the lifetime indexes increase slightly as the number of layers is increased. The electric field amplitude at the position where breakdown occurs is about 80% of the maximum electric field value.
  • Keywords
    electric breakdown; high-temperature superconductors; superconducting transformers; HTS transformer; breakdown-voltage-time characteristics; electrode multiwrapping; high-temperature superconducting transformer; maximum electric field value; point contact geometry; polyimide film; surface contact geometry; turn-to-turn models; Breakdown voltage; Dielectrics and electrical insulation; Electric breakdown; Geometry; High temperature superconductors; Polyimides; Power transformer insulation; Solid modeling; Superconducting epitaxial layers; Superconducting films; Breakdown; electric field; high-temperature super conducting (HTS) transformer; turn-to-turn models; voltage– time characteristics;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2008.917537
  • Filename
    4463830