DocumentCode :
1092262
Title :
Optical absorption of thin film on a Lambertian reflector substrate
Author :
Sheng, Ping
Author_Institution :
Exxon Corporate Research Science Laboratories, Clinton Township, Annandale, NJ
Volume :
31
Issue :
5
fYear :
1984
fDate :
5/1/1984 12:00:00 AM
Firstpage :
634
Lastpage :
636
Abstract :
A formula is derived for calculating the optical absorption of thin films deposited on a Lambertian reflector substrate. It is shown that compared with the case of flat reflecting substrate, the incoherent absorption is enhanced by a factor of m\\epsilon_{1} in the weak absorption limit, where ε1is the real part of the film dielectric constant and m \\simeq 2 is a slightly varying function of ε1. For a 0.5-µm a-SiHx(bandgap 1.7 eV) solar cell with a Lambertian reflector substrate, the total absorption in terms of the short-circuit current is calculated to be 18.63 mA/cm2.
Keywords :
Absorption; Dielectric constant; Dielectric substrates; Dielectric thin films; Light scattering; Optical films; Optical reflection; Optical scattering; Optical surface waves; Sputtering;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21582
Filename :
1483867
Link To Document :
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