DocumentCode :
1095084
Title :
IIB-3 aluminum alloys with titanium, tungsten, and copper for multilayer interconnections
Author :
Gardner, D. ; Michalka, Tim ; Saraswat, Krishna ; McVittie, J. ; Barbee, T. ; Meindl, J.
Volume :
31
Issue :
12
fYear :
1984
fDate :
12/1/1984 12:00:00 AM
Firstpage :
1965
Lastpage :
1965
Keywords :
Aluminum alloys; Annealing; Conductivity; Copper; Electromigration; Nonhomogeneous media; Rough surfaces; Surface roughness; Titanium; Tungsten;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21835
Filename :
1484120
Link To Document :
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