Title :
IIB-7 a study of the latchup susceptibility of CMOS to alpha particle upsets
fDate :
12/1/1984 12:00:00 AM
Keywords :
Alpha particles; Bipolar transistors; CMOS integrated circuits; CMOS memory circuits; CMOS technology; Electron devices; P-n junctions; Pulsed power supplies; Transconductance; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1984.21837
