DocumentCode

1095271

Title

IIIB-5 high-field electron capture and emission in nitrided oxides

Author

Wyatt, P.W. ; Senturia, S.D.

Volume

31

Issue

12

fYear

1984

fDate

12/1/1984 12:00:00 AM

Firstpage

1971

Lastpage

1972

Keywords

Active noise reduction; Annealing; Electron traps; Impact ionization; MOS devices; Noise generators; Noise level; Noise measurement; Radioactive decay; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1984.21852

Filename

1484137