DocumentCode :
109555
Title :
Spatial-Attraction-Based Markov Random Field Approach for Classification of High Spatial Resolution Multispectral Imagery
Author :
Hua Zhang ; Wenzhong Shi ; Yunjia Wang ; Ming Hao ; Zelang Miao
Author_Institution :
Key Lab. for Land Environ. & Disaster Monitoring of SBSM, China Univ. of Min. & Technol., Xuzhou, China
Volume :
11
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
489
Lastpage :
493
Abstract :
This letter presents a novel spatial-attraction-based Markov random field (MRF) (SAMRF) approach for high spatial resolution multispectral imagery (HSRMI) classification. First, the initial class label and class membership for each pixel are obtained by applying the maximum likelihood classifier (MLC) classification for the HSRMI. Second, to reduce the oversmooth classification in the traditional MRF, an adaptive weight MRF model is introduced by integrating the spatial attraction model into the traditional MRF. Finally, the initial classification map, generated in the first step, will be refined though the SAMRF regularization. Two different experiments were performed to evaluate the performance of the SAMRF, in comparison with standard MLC and MRF. Experimental results indicate that the SAMRF method achieved the highest accuracy, hence, providing an effective spectral-spatial classification method for the HSRMI.
Keywords :
geophysical image processing; geophysical techniques; image classification; HSRMI classification; MLC classification; SAMRF approach; effective spectral-spatial classification method; high spatial resolution multispectral imagery; maximum likelihood classifier; oversmooth classification; spatial-attraction-based Markov random field approach; Accuracy; Adaptation models; Educational institutions; Image edge detection; Markov processes; Remote sensing; Spatial resolution; Classification; Markov random field (MRF); high spatial resolution multispectral imagery (HSRMI); spatial attraction;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2013.2268968
Filename :
6588895
Link To Document :
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