DocumentCode :
1096589
Title :
IEEE Standard 1500 Compliance Verification for Embedded Cores
Author :
Benso, Alfredo ; Di Carlo, S. ; Prinetto, Paolo ; Zorian, Yervant
Author_Institution :
Politec. di Torino, Turin
Volume :
16
Issue :
4
fYear :
2008
fDate :
4/1/2008 12:00:00 AM
Firstpage :
397
Lastpage :
407
Abstract :
Core-based design and reuse are the two key elements for an efficient system-on-chip (SoC) development. Unfortunately, they also introduce new challenges in SoC testing, such as core test reuse and the need of a common test infrastructure working with cores originating from different vendors. The IEEE 1500 Standard for Embedded Core Testing addresses these issues by proposing a flexible hardware test wrapper architecture for embedded cores, together with a core test language (CTL) used to describe the implemented wrapper functionalities. Several intellectual property providers have already announced IEEE Standard 1500 compliance in both existing and future design blocks. In this paper, we address the problem of guaranteeing the compliance of a wrapper architecture and its CTL description to the IEEE Standard 1500. This step is mandatory to fully trust the wrapper functionalities in applying the test sequences to the core. We present a systematic methodology to build a verification framework for IEEE Standard 1500 compliant cores, allowing core providers and/or integrators to verify the compliance of their products (sold or purchased) to the standard.
Keywords :
IEEE standards; electronic design automation; embedded systems; integrated circuit design; logic testing; system-on-chip; IEEE standard 1500 compliance verification; SoC development; core test language; core-based design; embedded cores; intellectual property providers; system-on-chip; Electronic design automation (EDA) tools; IEEE 1500 Standard; unified modeling language (UML); verification of embedded cores;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.917412
Filename :
4469912
Link To Document :
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