Title :
A method for extracting SPICE2 junction capacitance parameters from measured data
Author :
Freese, B.A. ; Buller, G.L.
Author_Institution :
Storage Technology Corporation, Louisville, CO
fDate :
7/1/1984 12:00:00 AM
Abstract :
This paper describes a method for extracting SPICE2 junction capacitance parameters from measured data. The method is efficient and accurate, and is easily integrated into an automatic test and data analysis system.
Keywords :
Capacitance measurement; Capacitors; Data mining; Equations; Integrated circuit modeling; Jacobian matrices; Parameter extraction; Parasitic capacitance; System testing; Voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1984.25911
