DocumentCode :
1097781
Title :
A New Approach to Estimate the Effect of Single Event Transients in Complex Circuits
Author :
Aguirre, M.A. ; Baena, V. ; Tombs, J. ; Violante, M.
Author_Institution :
Sevilla Univ., Sevilla
Volume :
54
Issue :
4
fYear :
2007
Firstpage :
1018
Lastpage :
1024
Abstract :
We describe an approach for analyzing single event transients (SETs) in complex digital circuits. The approach combines accuracy with efficiency: simulation is used for propagating the SET from the affected gate to flip-flops/latches, while hardware emulation is then used to study the resulting single or multiple-bit upset. To assess the capability of the proposed approach to deal with complex circuits, we analyzed the propagation of SETs in a microprocessor. In this paper, we analyzed the contribution to the error rate of different SET´s pulse width, as well as the impact of the workload.
Keywords :
circuit simulation; digital integrated circuits; flip-flops; microcomputers; complex digital circuits; flip-flops/latches; hardware emulation; multiple-bit upset; single event transients; Circuit analysis; Circuit simulation; Digital circuits; Emulation; Error analysis; Flip-flops; Hardware; Latches; Microprocessors; Transient analysis; FPGA-based fault emulation; Fault injection; single event transients; soft errors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2007.895549
Filename :
4291678
Link To Document :
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