• DocumentCode
    1098544
  • Title

    Experimental and theoretical studies of a novel hetero-nipi reflection modulator

  • Author

    Poole, Philip J. ; Phillips, Chris C. ; Roberts, Christine ; Paxman, M.

  • Author_Institution
    Dept. of Phys., Imperial Coll. of Sci., Technol. & Med., London, UK
  • Volume
    30
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    1027
  • Lastpage
    1035
  • Abstract
    A novel GaAs/Al0.35Ga0.65As hetero-nipi all-optical reflection modulator has been investigated, both theoretically and experimentally. The modulation is found to be dominated by the refractive index changes that occur in the quantum wells as a result of optically induced electric field changes via the quantum-confined Stark effect. Good agreement is found between the theoretical and experimental behavior, with a maximum absolute experimental modulation of 11% and a maximum contrast ratio of 4.4:1 being observed at room temperature at optical pump densities of only 1.9 mW/cm2. A numerical model of the device is developed, which predicts large reflectivity modulations of greater than 53% with a contrast ratio of 25:1 in optimized device structures
  • Keywords
    III-V semiconductors; Stark effect; aluminium compounds; gallium arsenide; optical modulation; reflectivity; semiconductor superlattices; GaAs-AlGaAs; GaAs/Al0.35Ga0.65As; contrast ratio; hetero-nipi all-optical reflection modulator; hetero-nipi reflection modulator; large reflectivity modulations; maximum absolute experimental modulation; maximum contrast ratio; numerical model; optical pump densities; optically induced electric field changes; optimized device structures; quantum wells; quantum-confined Stark effect; refractive index changes; room temperature; Gallium arsenide; Numerical models; Optical modulation; Optical pumping; Optical reflection; Optical refraction; Optical variables control; Refractive index; Stark effect; Temperature;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.291372
  • Filename
    291372