• DocumentCode
    1099706
  • Title

    Excess currents in MINP-type solar cells

  • Author

    Rao, B.B. ; Banerjee, Sonali ; Anderson, Wayne A. ; Han, M.-K.

  • Author_Institution
    General Instruments Corp., Hicksville, NY
  • Volume
    32
  • Issue
    4
  • fYear
    1985
  • fDate
    4/1/1985 12:00:00 AM
  • Firstpage
    817
  • Lastpage
    821
  • Abstract
    MINP silicon solar cells with up to 16.5-percent efficiency have been fabricated using an ion-implanted shallow n-layer followed by a 20-25 Å insulator and low work-function metal grid, This design reduces surface recombination, suppresses dark current, and gives increased UV spectral response. Current-voltage data, in the dark and under AM1 illumination, have been taken from 90 to 375 K for four different designs. These data lead to determination of the excess-current component which, in some cases, gives a linear semilogarithmic behavior over much of the voltage range and an ideality factor which increases with decreasing temperature. These trends suggest a current component governed by field emission at the MIS interface and on the solar-cell edges, Control of this current in other cells gave great improvement in efficiency. Much of this excess-current component is eliminated by careful attention to the edges of the solar cell, leaving a small field-emission component under the MIS contact. High-efficiency passivated N/P cells show a small recombination component of excess current.
  • Keywords
    Coatings; Contacts; Dark current; Fabrication; Insulation; Lighting; Metal-insulator structures; Photovoltaic cells; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22025
  • Filename
    1484771