• DocumentCode
    110012
  • Title

    A Time-Domain Band-Gap Temperature Sensor in SOI CMOS for High-Temperature Applications

  • Author

    Pathrose, Jerrin ; Chengye Liu ; Chai, Kevin T. C. ; Yong Ping Xu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    62
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    436
  • Lastpage
    440
  • Abstract
    This brief presents a temperature sensor operating over a wide temperature range from 25°C to 225°C for oil well instrumentation applications. The temperature sensor is implemented with a simple time-domain architecture and a mapping function at the digital back end. The mapping function eliminates the need for a band-gap reference, whose temperature coefficient deteriorates the accuracy, particularly for high and wide temperature range of operation. The time-domain implementation results in low power consumption and chip area. With digital calibration at room temperature using a field-programmable gate array, the sensor achieves a worst case inaccuracy of +1.6 °C/ -1.5 °C and consumes only 20-μA current under a 4.5-V supply. The chip is fabricated with a commercial partially depleted silicon-on-insulator CMOS process and occupies a chip area of 0.41 mm2.
  • Keywords
    CMOS integrated circuits; calibration; elemental semiconductors; field programmable gate arrays; silicon; silicon-on-insulator; temperature measurement; temperature sensors; time-domain analysis; SOI CMOS; Si; band-gap reference; commercial partially depleted silicon-on-insulator; current 20 muA; digital back end; digital calibration; field-programmable gate array; high-temperature application; mapping function elimination; oil well instrumentation application; temperature -1.5 degC; temperature 1.6 degC; temperature 25 degC to 225 degC; temperature 293 K to 298 K; time-domain band-gap temperature sensor; voltage 4.5 V; CMOS integrated circuits; Calibration; Photonic band gap; Temperature distribution; Temperature measurement; Temperature sensors; Band-gap reference (BGR); Bandgap reference; High temperature electronics; Ratiometric measurement; Smart temperature sensor; high-temperature electronics; ratiometric measurement; smart temperature sensor;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2014.2386231
  • Filename
    6998086