DocumentCode
1101331
Title
Determination of surface- and bulk-generation parameters from dark-current measurements in surface-channel CCD´s
Author
Chik, Dawkung K. ; Kriegler, Rudolph J. ; Devenyi, Tibor F.
Author_Institution
Bell-Northern Research, Ottawa, Ontario, Canada
Volume
32
Issue
9
fYear
1985
fDate
9/1/1985 12:00:00 AM
Firstpage
1662
Lastpage
1664
Abstract
A technique for determining surface-generation velocity and bulk minority-carrier generation lifetime from measurements in surface-channel charge-coupled devices (SCCD) is described. Depleted surface-generation velocity of 1.1 cm/s and bulk minority-carrier generation lifetime of 130 µs have been determined in the channel region for the devices used, and are in good agreement with data obtained by other techniques.
Keywords
Charge carriers; Current measurement; DC generators; Electrodes; Electrons; Frequency; Low-frequency noise; MOS capacitors; Signal generators; Velocity measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.22176
Filename
1484922
Link To Document