Highly testable design of BiCMOS logic circuits

Most of the work reported in the literature to date on the testability of BiCMOS circuits has concentrated on fault characterization and the need for a suitable testing method that can address the peculiarities of BiCMOS circuits. The problem of adequately testing large BiCMOS logic networks remains open and complex. In this paper, we introduce a new design for testability technique for BiCMOS logic gates that results in highly testable BiCMOS logic circuits. The proposed design incorporates two features: a test charge/discharge path and built-in current sensing (BICS). The test charge/discharge path is activated only during testing and facilitates the testing of stuck-open faults using single test vectors. BICS facilitates testing of faults that cause excessive IDDQ. HSPICE simulation results show that the proposed design can detect stuck-open faults at a test speed of 10 MHz. Faults causing excessive IDDQ are detected by BICS with a detection time of 1 ns and a settling time of 2 ns. Impact of the proposed design on normal operation is minimal. The increase in propagation delay in normal operation is less than 3%. This compares very favorably with CMOS BICS reported in the literature, where the propagation delay increase was 20%, 14.4% respectively. The increase in the area is less than 15%