DocumentCode
1102011
Title
Calculation of Integrated Circuit Yields
Author
Whipple, W.L.
Author_Institution
IEEE
Issue
3
fYear
1969
fDate
3/1/1969 12:00:00 AM
Firstpage
268
Lastpage
268
Abstract
This note describes the simple calculation required to obtain circuit yields from component yields for integrated circuits. A graph is presented to illustrate the high component yields required for MSI and LSI technology.
Keywords
Circuit yields, component yields, integrated circuits.; Flip-flops; Integrated circuit reliability; Integrated circuit technology; Integrated circuit yield; Large scale integration; Manufacturing; Probability; Production; Yield estimation; Yttrium; Circuit yields, component yields, integrated circuits.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1969.222640
Filename
1671233
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