DocumentCode :
1103289
Title :
Coupled electrothermal modeling of microheaters using SPICE
Author :
Swart, Nicholas R. ; Nathan, Arokia
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume :
41
Issue :
6
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
920
Lastpage :
925
Abstract :
In this paper,,we report a novel simulation approach that computes both the transient and steady state electrothermal behavior in integrated circuit (IC) compatible thermally isolated microheaters. The resulting distribution of heat, current density and temperature, as well as the electrical terminal behavior have been obtained for realistic device structures. The results are based on a two-dimensional solution of the coupled system of partial differential equations that govern both electrical and heat transport in the device. Unlike standard numerical approaches for coupled systems, our technique is based on the behavioural models, available in most commercial circuit simulators (e.g., HSPICE), that allow synthesis of complex, nonlinear, and coupled circuit elements. The simulation results are in excellent agreement with measurement data of steady state and transient terminal characteristics, obtained under conditions of vacuum. We note that this modeling approach allows concurrent simulation (and subsequent optimization) of the performance of both the control electronics as well as the thermal element(s), within the same IC design environment
Keywords :
SPICE; current density; partial differential equations; semiconductor device models; simulation; HSPICE; SPICE; behavioural models; commercial circuit simulators; concurrent simulation; coupled electrothermal modeling; coupled system; current density; current temperature; electrical terminal behavior; heat; integrated circuit compatible thermally isolated microheaters; measurement data; microheaters; nonlinear coupled circuit element synthesis; optimization; partial differential equations; realistic device structures; simulation approach; steady state electrothermal behavior; transient electrothermal behavior; two-dimensional solution; Circuit simulation; Computational modeling; Coupling circuits; Current density; Electrothermal effects; Integrated circuit modeling; Resistance heating; SPICE; Steady-state; Temperature distribution;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.293302
Filename :
293302
Link To Document :
بازگشت