• DocumentCode
    1104236
  • Title

    Excess magnetization due to the presence of the matrix in a commercialized ultra fine multifilamentary NbTi composite with very fine filaments and Cu30%Ni matrix

  • Author

    Morita, Koji ; Ito, D.

  • Author_Institution
    Tokyo Metropolitan Univ., Japan
  • Volume
    32
  • Issue
    4
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    2756
  • Lastpage
    2759
  • Abstract
    We are studying the relation between the occurrence of the proximity effect coupling and the a.c. critical current degradation at low field in an ultra line multifilamentary NbTi superconducting composite for a.c. use. The occurrence of the proximity effect coupling between the ultra fine filaments across the Cu30%Ni matrix in commercialized a.c. wires was confirmed by comparing magnetization for two wires with and without matrix. Excess magnetization due to the proximity effect coupling was observed in both magnetization of the initial magnetization curves and the hysteresis loop for the clad wire at low field. Based on the results, the a.c. quench current degradation mechanism for these a.c. wires at low field is discussed
  • Keywords
    copper alloys; magnetic hysteresis; magnetisation; multifilamentary superconductors; nickel alloys; niobium alloys; proximity effect (superconductivity); superconducting materials; titanium alloys; AC critical current degradation; AC quench current degradation mechanism; Cu-30%Ni matrix; Cu-Ni; NbTi; clad wire at low field; commercialized ultra fine multifilamentary NbTi composite; excess magnetization; hysteresis loop; initial magnetization curves; proximity effect; very fine filaments; Commercialization; Couplings; Critical current; Degradation; Magnetization; Multifilamentary superconductors; Niobium compounds; Proximity effect; Superconducting filaments and wires; Titanium compounds;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.511445
  • Filename
    511445