• DocumentCode
    1104359
  • Title

    Hysteresis losses in Bi-2223 superconductors

  • Author

    Paasi, Jaakko ; Tuohimaa, Antti

  • Author_Institution
    Lab. of Electr. & Magnetism, Tampere Univ. of Technol., Finland
  • Volume
    32
  • Issue
    4
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    2796
  • Lastpage
    2799
  • Abstract
    In this study we examine magnetic hysteresis losses in Bi-2223 bulk superconductors. Two kinds of hysteresis losses were found in the samples: losses in superconducting grains and losses due to the intergranular weak link structure. Total losses at 77 K were about an order of magnitude higher than losses in grains. This indicates the domination of intergranular hysteresis losses with respect to intragrain losses. To understand the experimental results, we numerically simulated the behavior with model specimens, where different kinds of Josephson junction arrays worked as the models for the intergrain system. A special attention was paid to the influence of porosity, second phase particles, and magnetically induced granularity on the hysteresis losses. If at least one of the inhomogeneity sources was present, the magnetization of the array could exhibit remarkable hysteresis and losses
  • Keywords
    Josephson effect; bismuth compounds; calcium compounds; grain boundaries; high-temperature superconductors; losses; magnetic hysteresis; strontium compounds; 77 K; Bi-2223 superconductors; Bi2Sr2Ca2Cu3O10 ; Josephson junction arrays; high temperature superconductor; intergrain system; intergranular weak link structure; magnetic hysteresis losses; magnetically induced granularity; porosity; second phase particles; superconducting grains; total losses; Granular superconductors; High temperature superconductors; Josephson junctions; Magnetic field measurement; Magnetic flux; Magnetic hysteresis; Magnetization; Powders; Superconducting magnets; Superconductivity;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.511455
  • Filename
    511455