DocumentCode :
1104573
Title :
Radiation Characteristics of Electrically Small Devices in a TEM Transmission Cell
Author :
Tippet, John C. ; Chang, David C.
Author_Institution :
Electromagnetics Laboratory, Department of Electrical Engineering, University of Colorado, Boulder, CO 80309. (303) 492-8719 or 7539
Issue :
4
fYear :
1976
Firstpage :
134
Lastpage :
140
Abstract :
When making EMC measurements inside a shielded enclosure, the radiation characteristics of the device being tested changes. In this paper, the change in radiation resistance of dipole sources located inside a National Bureau of Standards TEM transmission cell is determined. In many cases a practical device can be modeled by dipole sources. In these cases the analysis allows one to predict the device´s radiation characteristics in other environments (e. g., free space).
Keywords :
Current measurement; Cutoff frequency; Electrical resistance measurement; Electromagnetic measurements; Electromagnetic radiation; Impedance; NIST; TEM cells; Testing; Transmission line theory;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.1976.303492
Filename :
4090986
Link To Document :
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