DocumentCode
1105219
Title
InGaAs microwave switch transistors for phase shifter circuits
Author
Shokrani, Mohsen ; Kapoor, Vik J.
Author_Institution
Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
Volume
42
Issue
5
fYear
1994
fDate
5/1/1994 12:00:00 AM
Firstpage
772
Lastpage
778
Abstract
A new InGaAs insulated-gate FET (IGFET) with 1 μm gate length and three different gate widths has been designed, fabricated and characterized as switch devices for microwave control applications in phase shifter circuits. The devices employed a plasma deposited silicon dioxide gate insulator and had multiple air bridged source regions. The details of the DC current-voltage (I-V) characteristics and small signal S-parameter measurements up to 20 GHz are presented. The switch IGFET´s had a drain saturation current density of 300 mA/mm gate width with breakdown voltages of higher than 35 V. An insertion loss of 1.0, 0.6, and 0.4 dB at 10 GHz and 1.4, 0.8, and 0.4 dB at 20 GHz have been measured for the 300, 600, and 1200 μm gate width IGFET´s, respectively. Equivalent circuit models fitted to the measured S-parameters for IGFET´s yielded on-state resistances from 10.7 to 3.3 Ω, off-state resistances from 734.4 to 186.8 R and off-state capacitances from 0.084 to 0.3 pF as the gate width is increased from 300 to 1200 μm The simulation results using IGFET models for the phase shifter circuits indicated a maximum phase error of 0.11°, 0.26°, and 0.479 with 0.74, 0.96, and 1.49 dB maximum insertion loss and greater than 33, 26, and 19 dB return loss for the 11.25°, 22.5°, and 45° phase bits, respectively, over the 9.5-10.5 GHz frequency band
Keywords
III-V semiconductors; MMIC; S-parameters; equivalent circuits; gallium arsenide; indium compounds; microwave measurement; phase shifters; semiconductor switches; 0.084 to 0.3 pF; 0.4 to 1.4 dB; 1 micron; 10 to 20 GHz; 186.8 to 734.4 ohm; 3.3 to 10.7 ohm; 300 to 1200 micron; DC current-voltage characteristics; InGaAs; MMICs; breakdown voltages; drain saturation current density; equivalent circuit models; gate widths; insertion loss; insulated-gate FET; microwave switch transistors; multiple air bridged source regions; off-state capacitances; off-state resistances; on-state resistances; phase shifter circuits; plasma deposited gate insulator; small signal S-parameter measurements; Indium gallium arsenide; Insulation; Microwave FETs; Microwave circuits; Microwave devices; Microwave transistors; Phase shifters; Plasma measurements; Switches; Switching circuits;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.293524
Filename
293524
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