DocumentCode
1105402
Title
Micropatterning of high-T c superconducting film by nitrogen ion beam and Ta/resist multilayer mask
Author
Nagai, Y. ; Tsuru, K. ; Terada, A. ; Yanagisawa, K.
Author_Institution
NTT Appl. Electron. Lab., Ibaraki, Japan
Volume
27
Issue
2
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
1622
Lastpage
1625
Abstract
Micropatterning of BiSrCaCuO/ss superconducting film is investigated for electronic devices. A combination of nitrogen ion beam and Ta/resist multilayer mask is found to be suitable for achieving micropatterns with sharp edges because of its high selectivity of more than 20. The resist layer enables high-resolution masks to be formed on relatively rough surfaces. Also, an Au protective layer successfully avoids the critical temperature degradation due to oxygen plasma. As a result, BiSrCaCuO microbridges, 1.5-μm wide and 1-μm thick, can be patterned without degradation of the critical temperature and critical current density. Accordingly, these patterning techniques are thought to be useful for fabricating SQUIDs (superconducting quantum interference devices) and microwave components
Keywords
bismuth compounds; calcium compounds; high-temperature superconductors; strontium compounds; superconducting junction devices; superconducting thin films; BiSrCaCuO/ss; N ion beam; SQUIDs; Ta; Ta/resist multilayer mask; critical current density; critical temperature degradation; high selectivity; high temperature superconductor; microbridges; micropatterning; microwave components; sharp edges; superconducting film; Degradation; Ion beams; Nitrogen; Nonhomogeneous media; Plasma temperature; Resists; Rough surfaces; SQUIDs; Superconducting films; Superconducting microwave devices;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.133496
Filename
133496
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