• DocumentCode
    1105402
  • Title

    Micropatterning of high-Tc superconducting film by nitrogen ion beam and Ta/resist multilayer mask

  • Author

    Nagai, Y. ; Tsuru, K. ; Terada, A. ; Yanagisawa, K.

  • Author_Institution
    NTT Appl. Electron. Lab., Ibaraki, Japan
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    1622
  • Lastpage
    1625
  • Abstract
    Micropatterning of BiSrCaCuO/ss superconducting film is investigated for electronic devices. A combination of nitrogen ion beam and Ta/resist multilayer mask is found to be suitable for achieving micropatterns with sharp edges because of its high selectivity of more than 20. The resist layer enables high-resolution masks to be formed on relatively rough surfaces. Also, an Au protective layer successfully avoids the critical temperature degradation due to oxygen plasma. As a result, BiSrCaCuO microbridges, 1.5-μm wide and 1-μm thick, can be patterned without degradation of the critical temperature and critical current density. Accordingly, these patterning techniques are thought to be useful for fabricating SQUIDs (superconducting quantum interference devices) and microwave components
  • Keywords
    bismuth compounds; calcium compounds; high-temperature superconductors; strontium compounds; superconducting junction devices; superconducting thin films; BiSrCaCuO/ss; N ion beam; SQUIDs; Ta; Ta/resist multilayer mask; critical current density; critical temperature degradation; high selectivity; high temperature superconductor; microbridges; micropatterning; microwave components; sharp edges; superconducting film; Degradation; Ion beams; Nitrogen; Nonhomogeneous media; Plasma temperature; Resists; Rough surfaces; SQUIDs; Superconducting films; Superconducting microwave devices;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133496
  • Filename
    133496