DocumentCode
110553
Title
A Programmable Calibration/BIST Engine for RF and Analog Blocks in SoCs Integrated in a 32 nm CMOS WiFi Transceiver
Author
Carballido, J. ; Hermosillo, J. ; Veloz, A. ; Arditti, D. ; Del Rio, A. ; Borrayo, E. ; Guzman, M.E. ; Lakdawala, Hasnain ; Verhelst, Marian
Author_Institution
Syst. Integration & Adaptivity Group, Intel Labs., Guadalajara, Mexico
Volume
48
Issue
7
fYear
2013
fDate
Jul-13
Firstpage
1669
Lastpage
1679
Abstract
This paper presents a flexible and portable digital framework for Built-in Self-Test (BIST) and calibration of RF/analog circuitry. Novel to the proposed testing framework, is a reusable, flexible, drop-in IP core, composed of a centralized custom processing engine with data path, memory architecture and instruction set optimized for efficient execution of compute intensive test and calibration algorithms. The innovative BIST engine is complemented with a calibration and test sequencing methodology exploiting the embedded test hardware, to dynamically correct for transceiver imbalances and non-idealities, as well as to estimate performance parameters such as Error Vector Magnitude (EVM). The engine has been integrated with a WiFi transceiver in a 32 nm SoC test chip to demonstrate the functionality of this framework. This implementation covers an area of 0.63 mm2 and provides similar performance (e.g., improvements up to 10 dB in EVM for Rx IQ imbalance compensation) to off-chip testing without relying on expensive equipment.
Keywords
analogue circuits; built-in self test; calibration; instruction sets; parameter estimation; radiofrequency integrated circuits; system-on-chip; transceivers; wireless LAN; BIST engine; CMOS WiFi transceiver; EVM; RF-analog circuitry calibration; SoC; analog block; built-in self-test; calibration algorithm; centralized custom processing engine; compute intensive test; data path; drop-in IP core; embedded test hardware; error vector magnitude; flexible digital framework; instruction set; memory architecture; off-chip testing; performance parameter estimation; portable digital framework; programmable calibration; size 32 nm; test sequencing methodology; testing framework; Built-in self-test; Calibration; Engines; Radio frequency; System-on-chip; Transceivers; Calibration; IQ imbalance; PAPD; RF; SoC; manufacturing; radio; testing; transceiver;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2013.2253401
Filename
6488888
Link To Document