DocumentCode
110613
Title
Non-Rigid Graph Registration Using Active Testing Search
Author
Serradell, Eduard ; Pinheiro, Miguel Amavel ; Sznitman, Raphael ; Kybic, Jan ; Moreno-Noguer, Francesc ; Fua, Pascal
Author_Institution
Institut de Rob??tica i Inform??tica Industrial, CSIC-UPC, Barcelona, Spain
Volume
37
Issue
3
fYear
2015
fDate
March 1 2015
Firstpage
625
Lastpage
638
Abstract
We present a new approach for matching sets of branching curvilinear structures that form graphs embedded in
or
and may be subject to deformations. Unlike earlier methods, ours does not rely on local appearance similarity nor does require a good initial alignment. Furthermore, it can cope with non-linear deformations, topological differences, and partial graphs. To handle arbitrary non-linear deformations, we use Gaussian process regressions to represent the geometrical mapping relating the two graphs. In the absence of appearance information, we iteratively establish correspondences between points, update the mapping accordingly, and use it to estimate where to find the most likely correspondences that will be used in the next step. To make the computation tractable for large graphs, the set of new potential matches considered at each iteration is not selected at random as with many RANSAC-based algorithms. Instead, we introduce a so-called Active Testing Search strategy that performs a priority search to favor the most likely matches and speed-up the process. We demonstrate the effectiveness of our approach first on synthetic cases and then on angiography data, retinal fundus images, and microscopy image stacks acquired at very different resolutions.
Keywords
Gaussian processes; Image resolution; Microscopy; Noise; Retina; Search problems; Testing; Graph matching; active testing search; non-rigid registration;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2014.2343235
Filename
6866165
Link To Document