DocumentCode
1106328
Title
Bulk unipolar camel diodes formed using indium implantation into silicon
Author
Shannon, J.M. ; Goldsmith, B.J.
Author_Institution
Philips Research Laboratories, Redhill, Surrey
Volume
6
Issue
11
fYear
1985
fDate
11/1/1985 12:00:00 AM
Firstpage
583
Lastpage
585
Abstract
Bulk unipolar camel diodes have been made by implanting indium and arsenic into 〈100〉 silicon at low energies. It is found that a wide range of barrier heights can be obtained simply by selecting the indium energy, ideality factors being <1.1 in some cases, and leakage currents <150 nA cm-2following activation of the implants at 650°C.
Keywords
Annealing; Boron; Hot carrier injection; Implants; Impurities; Indium; Leakage current; Schottky diodes; Silicon; Tail;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1985.26238
Filename
1485391
Link To Document