• DocumentCode
    1106328
  • Title

    Bulk unipolar camel diodes formed using indium implantation into silicon

  • Author

    Shannon, J.M. ; Goldsmith, B.J.

  • Author_Institution
    Philips Research Laboratories, Redhill, Surrey
  • Volume
    6
  • Issue
    11
  • fYear
    1985
  • fDate
    11/1/1985 12:00:00 AM
  • Firstpage
    583
  • Lastpage
    585
  • Abstract
    Bulk unipolar camel diodes have been made by implanting indium and arsenic into 〈100〉 silicon at low energies. It is found that a wide range of barrier heights can be obtained simply by selecting the indium energy, ideality factors being <1.1 in some cases, and leakage currents <150 nA cm-2following activation of the implants at 650°C.
  • Keywords
    Annealing; Boron; Hot carrier injection; Implants; Impurities; Indium; Leakage current; Schottky diodes; Silicon; Tail;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1985.26238
  • Filename
    1485391