DocumentCode
1106523
Title
First life-test results on planar p-i-n InGaAs/InP photodiodes passivated with SiO2 or SiNx +SiO2 or SiNx layers
Author
Ripoche, G. ; Decor, Ph. ; Blanjot, C. ; Bourdon, B. ; Salsac, P. ; Duda, E.
Author_Institution
Centre de Recherches de la Compagnie Générale d´´Electricite, Marcoussis, France
Volume
6
Issue
12
fYear
1985
fDate
12/1/1985 12:00:00 AM
Firstpage
631
Lastpage
633
Abstract
This letter reports the results obtained with planar p-in photodiodes realized using three different passivating coatings and compares their performances and long-term stability in view of highly reliable component development.
Keywords
Cleaning; Dark current; Detectors; Indium gallium arsenide; Indium phosphide; Life testing; PIN photodiodes; Passivation; Silicon compounds; Temperature sensors;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1985.26256
Filename
1485409
Link To Document