Inside view

Volume

50

Issue

4

fYear

2014

fDate

February 13 2014

Firstpage

237

Lastpage

237

Abstract

We have demonstrated a powerful noncontact, non-destructive tool to study the properties of carbon nanotubes (CNT) thin films by using a Rohde and Schwarz ZVA 24 vector network analyser (VNA) associated with frequency extenders, in the frequency range of 220-500 GHz. The scattering parameters ( reflection and transmission of the CNT sample) were measured simultaneously, and the experiment was carried out in a free space environment. We used the Nicholson-Ross-Weir (NRW) approach too, and since the thin films were deposited on a substrate, we have carefully removed the effects of the substrate before proceeding to extract the properties of the films alone. A comprehensive characterisation of the electrical and optical properties of CNTs is necessary, so in order to meet this requirement, we have presented the study of both conductivity and refractive index of multi-walled carbon nanotubes (MWCNTs).

Keywords

carbon nanotubes; electrical conductivity; infrared spectra; nondestructive testing; refractive index; terahertz wave spectra; thin films; transparency; ultraviolet spectra; visible spectra; C; SiO₂; THz domain absorption; conductivity; frequency 220 GHz to 500 GHz; fused quartz; infrared light; multiwalled carbon nanotube thin films; noncontact electrical characterisations; noncontact optical characterisations; nondestructive testing; refractive index; substrate material; subterahertz radiations; terahertz radiations; transparency; visible light; wireless communication applications;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el.2014.0388

Filename

6746258