• DocumentCode
    1107480
  • Title

    Improvements to "A new AC measurement technique to accurately determine MOSFET constants"

  • Author

    Thoma, Morgan J. ; Westgate, Charles R.

  • Author_Institution
    AT&T Bell Laboratories, Allentown, PA
  • Volume
    33
  • Issue
    2
  • fYear
    1986
  • fDate
    2/1/1986 12:00:00 AM
  • Firstpage
    312
  • Lastpage
    313
  • Abstract
    Modifications and improvements to the measurement technique described in [1] are presented. In particular, the iterative procedure used to obtain an accurate value for device threshold voltage has been eliminated and replaced by direct calculation. The measurement technique has also been applied to a modulation of the substrate potential in order to obtain an estimate of threshold parameters.
  • Keywords
    Current measurement; Degradation; Extrapolation; Frequency; Intrusion detection; MOSFET circuits; Measurement techniques; Parameter estimation; Taylor series; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22485
  • Filename
    1485702
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1107480