DocumentCode
1107909
Title
High-density integrated planar lightwave circuits using SiO2 -GeO2 waveguides with a high refractive index difference
Author
Suzuki, Senichi ; Yanagisawa, Masahiro ; Hibino, Yoshinori ; Oda, Kazuhiro
Author_Institution
NTT Opto-Electron. Labs., Ibaraki, Japan
Volume
12
Issue
5
fYear
1994
fDate
5/1/1994 12:00:00 AM
Firstpage
790
Lastpage
796
Abstract
GeO2-doped silica waveguides with a high refractive index difference of 1.5% are successfully fabricated on Si substrates. Their propagation loss, measured in 200-cm-long test circuits with a minimum curvature radius of 2 mm, is 0.073 dB/cm. The waveguides are used as high-density integrated planar lightwave circuits in 1×4 Mach-Zehnder (MZ) type multi/demultiplexers for optical frequency division multiplexing (FDM) transmission systems and in modified MZ type multi/demultiplexers with a ring resonator, which have a compact device size of 15×50 mm2 and a frequency spacing of 10 GHz
Keywords
demultiplexing equipment; frequency division multiplexing; germanate glasses; integrated optics; multiplexing equipment; optical communication equipment; optical glass; optical losses; optical resonators; optical waveguides; refractive index; silicon compounds; 200 cm; GeO2-doped silica waveguides; Mach-Zehnder type multi/demultiplexers; Si substrates; SiO2-GeO2; curvature radius; high-density integrated planar lightwave circuits; optical frequency division multiplexing transmission systems; propagation loss; refractive index difference; ring resonator; Circuit testing; Frequency division multiplexing; Integrated circuit measurements; Loss measurement; Optical planar waveguides; Optical ring resonators; Optical waveguides; Propagation losses; Refractive index; Silicon compounds;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.293970
Filename
293970
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