• DocumentCode
    1108546
  • Title

    A steady-state temperature model for silicon recrystallization using light sources

  • Author

    Kyung, Chong Min ; Yang, Y.Y.

  • Author_Institution
    Korea Advanced Institute of Science and Technology, Seoul, Korea
  • Volume
    33
  • Issue
    6
  • fYear
    1986
  • fDate
    6/1/1986 12:00:00 AM
  • Firstpage
    864
  • Lastpage
    865
  • Abstract
    A simplified, yet accurate enough temperature calculation scheme is proposed for SOI recrystallization using light sources. The assumption that the total amount of heat generated per unit area in the SOI wafer by the light absorption is balanced by the total outgoing radiation flux is shown to significantly reduce the CPU time to calculate the steady-state wafer temperature. The calculation results of this model have agreed fairly well with those of the rigorous and time-consuming Poisson solver (less than 3 K of temperature discrepancy for a typical case).
  • Keywords
    Absorption; Computational efficiency; Electron devices; Light sources; Semiconductor device modeling; Semiconductor films; Silicon; Steady-state; Temperature dependence; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22580
  • Filename
    1485797