DocumentCode
1109737
Title
35-GHz performance of single and quadruple power heterojunction HEMT´s
Author
Sovero, E. ; Gupta, Aditya K. ; Higgins, J.A. ; Hill, W.A.
Author_Institution
Rockwell International Corporation, Thousand Oaks, CA
Volume
33
Issue
10
fYear
1986
fDate
10/1/1986 12:00:00 AM
Firstpage
1434
Lastpage
1438
Abstract
The potential of single hetrojunction (SHJ) and quadruple heterojunction (QHJ) HEMT devices to provide power amplification at the
-band frequencies has been measured. The power level observed, from QHJ devices that have gate lengths of 0.5 µm and gate widths of 200 µm, has been over +20 dBm when gain is compressed below the small signal level by 2 dB. The small-signal gain was 5.2 dB at 35 GHz. The power level demonstrated by the SHJ devices is lower than that of the QHJ devices due to the lower "two-dimensional electron gas" sheet carrier density. Our measurements have shown a saturated power level of +15.3 dBm devices of the same geometry as the above-mentioned QHJ devices. The power performance in both cases (QHJ and SHJ) has been obtained with high efficiencies of 38 and 21 percent, respectively. These performance data represent the highest levels of gain and power reported at
-band frequencies from transistors that employ a 0.5-µm geometry.
-band frequencies has been measured. The power level observed, from QHJ devices that have gate lengths of 0.5 µm and gate widths of 200 µm, has been over +20 dBm when gain is compressed below the small signal level by 2 dB. The small-signal gain was 5.2 dB at 35 GHz. The power level demonstrated by the SHJ devices is lower than that of the QHJ devices due to the lower "two-dimensional electron gas" sheet carrier density. Our measurements have shown a saturated power level of +15.3 dBm devices of the same geometry as the above-mentioned QHJ devices. The power performance in both cases (QHJ and SHJ) has been obtained with high efficiencies of 38 and 21 percent, respectively. These performance data represent the highest levels of gain and power reported at
-band frequencies from transistors that employ a 0.5-µm geometry.Keywords
Charge carrier density; Frequency measurement; Gallium arsenide; Geometry; HEMTs; Heterojunctions; Performance gain; Power generation; Power measurement; Radio access networks;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22691
Filename
1485908
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