DocumentCode
1109803
Title
On-Chip Voltage Down Converter to Improve SRAM Read/Write Margin and Static Power for Sub-Nano CMOS Technology
Author
Lai, Fang-Shi ; Lee, Chia-Fu
Author_Institution
Taiwan Semicond. Manuf. Co., Hsinchu
Volume
42
Issue
9
fYear
2007
Firstpage
2061
Lastpage
2070
Abstract
VDC-based dynamic power supply approach has been demonstrated to effectively improve the read margin, write margin and static power dissipation for the sub-nano SRAM design. The static power dissipation is found to be 5times improvement in the room and high temperatures while the chip is in the standby mode. The measured data indicate the excellent Vccmin improvement at around 240 mV. This 2M 65 nm SRAM chip can operate at 0.7 V with the help of the on-chip VDC. Furthermore, with the programmability of the VDC, we can optimize the read margin and write margin separately to have dramatic yield improvement. In the advancement of CMOS technology, the VDC approach can improve the future SRAM cell operation without additional external power supplies and complicate design modification.
Keywords
CMOS memory circuits; SRAM chips; nanoelectronics; power supply circuits; SRAM cell operation; SRAM read-write margin; VDC-based dynamic power supply approach; design modification; on-chip voltage down converter; programmability; size 65 nm; static power dissipation; subnano CMOS technology; voltage 0.7 V; voltage 240 mV; CMOS technology; Energy consumption; Fluctuations; MOSFETs; Power dissipation; Power supplies; Random access memory; SRAM chips; Static power converters; Threshold voltage; Read margin; SRAM; Vccmin; static power; voltage down converter (VDC); write margin;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2007.903072
Filename
4295196
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