DocumentCode
111000
Title
High-Voltage Breakdown and the Gunn Effect in GaAs/AlGaAs Nanoconstrictions
Author
Rui Chen ; Weilu Gao ; Xuan Wang ; Aizin, Gregory R. ; Mikalopas, John ; Arikawa, Takashi ; Tanaka, Koichiro ; Eason, David B. ; Strasser, Gottfried ; Kono, Junichiro ; Bird, Jonathan P.
Author_Institution
Dept. of Electr. Eng., Univ. of Buffalo, Buffalo, NY, USA
Volume
14
Issue
3
fYear
2015
fDate
May-15
Firstpage
524
Lastpage
530
Abstract
We demonstrate dramatic breakdown behavior in the current through GaAs/AlGaAs nanoconstrictions (NCs), and find that this exhibits multiple signatures characteristic of the Gunn effect. These include current fluctuations and hysteresis, and electroluminescence that are consistent with the formation of Gunn domains. An analytical model is developed to describe the current-voltage characteristics of the NCs prior to the onset of the breakdown, and reveals the conduction through them to be barrier limited under low bias. A comparison of the results of these calculations with experiment furthermore suggests that the Gunn effect in these devices is triggered, once the phenomenon of drain-induced barrier lowering becomes sufficiently developed to support the injection of large numbers of electrons into the NC. Our paper, therefore, demonstrates how the Gunn effect may be manipulated through nanoscale tailoring of semiconductors, a result that may have implications for the development of solid-state terahertz technology.
Keywords
Gunn effect; III-V semiconductors; aluminium compounds; electroluminescence; gallium arsenide; nanostructured materials; GaAs-AlGaAs; Gunn effect; current fluctuations; current-voltage characteristics; drain induced barrier lowering; electroluminescence; high voltage breakdown; hysteresis; nanoconstrictions; Electric breakdown; Gallium arsenide; HEMTs; Hysteresis; Impact ionization; MODFETs; Temperature measurement; Gunn effect; Terahertz devices; nano-constrictions; nanoconstrictions; nonequilibrium transport; terahertz devices;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2015.2414902
Filename
7064767
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