• DocumentCode
    1111085
  • Title

    Subnanosecond 300 V diffused step recovery diode

  • Author

    Chudobiak, M.J. ; Walkey, D.J.

  • Author_Institution
    Avtech Electrosyst. Ltd., Ottawa, Ont., Canada
  • Volume
    32
  • Issue
    16
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    1513
  • Lastpage
    1515
  • Abstract
    A novel diffused step recovery diode structure is presented, which can operate with reverse voltages of several hundred volts and which exhibits long lifetimes of several microseconds. Experimental results for fabricated devices are presented for 300 V operation into a 50 Ω load, with 1.7 ns (typical) and 0.9 ns (best-case) transition times
  • Keywords
    charge storage diodes; doping profiles; electric breakdown; semiconductor switches; 0.9 to 1.7 ns; 300 V; SRD; breakdown voltage; charge storage diodes; diffused Gaussian doping structure; diffused step recovery diode; subnanosecond operation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960987
  • Filename
    511931