• DocumentCode
    1111641
  • Title

    Reliability of augmented tree networks under pin-out constraints

  • Author

    Menezes, Bernard L.

  • Author_Institution
    Maryland Univ., College Park, MD, USA
  • Volume
    43
  • Issue
    2
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    321
  • Lastpage
    326
  • Abstract
    The binary tree network provides a cost-efficient topology for parallel computers. However, its poor reliability makes it unattractive for applications that demand high reliability. This has motivated consideration of several augmented tree networks, but these networks offer increased reliability at the expense of increased node fanout. This paper studies 2 augmented tree networks that achieve high reliability with low node fanout. Exact reliabilities of both networks are computed in O(log(number of leaves)) time by deriving a system of recurrences that exploit their recursive construction. These structures are considerably more reliable than the single tree. Moreover, reliability is sensitive to the actual inter-leaf augmentation scheme-even a minor change has a noticeable impact on reliability. Two other measures of reliability, mean time-to-failure and mission time are estimated. A closed-form approximate expression for reliability of one of these networks is obtained; it agrees quite well with the exact value
  • Keywords
    computational complexity; failure analysis; fault tolerant computing; multiprocessor interconnection networks; parallel architectures; reliability; reliability theory; trees (mathematics); O(log(number of leaves)) time; augmented tree networks reliability; closed-form approximate expression; inter-leaf augmentation scheme; low node fanout; mean time-to-failure; mission time; pin-out constraints; recursive construction; reliability; Binary trees; Computer network reliability; Computer networks; Database machines; Educational institutions; Fault tolerance; Multiprocessor interconnection networks; Switches; Telecommunication traffic; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.295015
  • Filename
    295015