DocumentCode
1111665
Title
Interval-availability distribution of 2-state systems with exponential failures and phase-type repairs
Author
Sericola, B.
Author_Institution
IRISA, Rennes, France
Volume
43
Issue
2
fYear
1994
fDate
6/1/1994 12:00:00 AM
Firstpage
335
Lastpage
343
Abstract
Interval availability is a dependability measure defined as the fraction of time during which a system is in operation over a finite observation period. Usually, for computing systems, the models used to evaluate interval availability distribution are Markov models. Numerous papers using these models have been published, and only complex numerical methods have been proposed as solutions to this problem even in simple cases such as the 2-state Markov model. This paper proposes a new way to compute this distribution when the model is a 2-state semi-Markov process in which the holding times have an exponential distribution for the operational state and a phase-type distribution for the nonoperational one. The main contribution of this paper is to define a new algorithm to compute the interval availability distribution for systems having only one operational state. The computational complexity depends weakly on the number of states of the system, and sometimes it can deal also with infinite state spaces. Moreover, simple closed expressions of this distribution are shown when repair periods are of the Erlang type with eventually absorbing states
Keywords
Markov processes; computational complexity; computer maintenance; fault tolerant computing; reliability; algorithm; closed expressions; computational complexity; computing systems; dependability; exponential distribution; holding times; infinite state spaces; interval availability distribution; observation period; operational state; phase-type distribution; repair periods; two-state semi-Markov process; Availability; Distributed computing; Exponential distribution; Failure analysis; Fault tolerant systems; Markov processes; Partial differential equations; Phase measurement; State-space methods; Time measurement;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.295019
Filename
295019
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