Title :
Electronic switching effect and phase-change transition in chalcogenide materials
Author :
Redaelli, A. ; Pirovano, A. ; Pellizzer, F. ; Lacaita, A.L. ; Ielmini, D. ; Bez, R.
Author_Institution :
Dipt. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
Abstract :
The threshold switching mechanism in amorphous chalcogenides is investigated, showing experimental data that once and for all demonstrate its electronic nature. The physical mechanisms responsible for the switching to the highly conductive state are discussed and the impact of cumulative read-out pulses is also investigated, showing that phase-change transitions induced by usual reading operations in phase-change memory cells are completely negligible.
Keywords :
chalcogenide glasses; semiconductor storage; semiconductor switches; amorphous chalcogenides; amorphous semiconductors; crystal growth; electronic switching effect; nonvolatile memories; phase change memories; phase-change memory cells; phase-change transition; threshold switching mechanism; Amorphous materials; Amorphous semiconductors; Conducting materials; Electric resistance; Electrical resistance measurement; Nonvolatile memory; Phase change materials; Phase change memory; Pulse measurements; Threshold voltage; Amorphous semiconductors; PCM; chalcogenide; crystal growth; nonvolatile memories; phase change memories;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2004.836032