DocumentCode :
1113072
Title :
Electronic switching effect and phase-change transition in chalcogenide materials
Author :
Redaelli, A. ; Pirovano, A. ; Pellizzer, F. ; Lacaita, A.L. ; Ielmini, D. ; Bez, R.
Author_Institution :
Dipt. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
Volume :
25
Issue :
10
fYear :
2004
Firstpage :
684
Lastpage :
686
Abstract :
The threshold switching mechanism in amorphous chalcogenides is investigated, showing experimental data that once and for all demonstrate its electronic nature. The physical mechanisms responsible for the switching to the highly conductive state are discussed and the impact of cumulative read-out pulses is also investigated, showing that phase-change transitions induced by usual reading operations in phase-change memory cells are completely negligible.
Keywords :
chalcogenide glasses; semiconductor storage; semiconductor switches; amorphous chalcogenides; amorphous semiconductors; crystal growth; electronic switching effect; nonvolatile memories; phase change memories; phase-change memory cells; phase-change transition; threshold switching mechanism; Amorphous materials; Amorphous semiconductors; Conducting materials; Electric resistance; Electrical resistance measurement; Nonvolatile memory; Phase change materials; Phase change memory; Pulse measurements; Threshold voltage; Amorphous semiconductors; PCM; chalcogenide; crystal growth; nonvolatile memories; phase change memories;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2004.836032
Filename :
1336971
Link To Document :
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