• DocumentCode
    1114167
  • Title

    A 0.016 mm ^{2} , 2.4 GHz RF Signal Quality Measurement Macro for RF Test and Diagnosis

  • Author

    Nose, Koichi ; Mizuno, Masayuki

  • Author_Institution
    NEC, Sagamihara
  • Volume
    43
  • Issue
    4
  • fYear
    2008
  • fDate
    4/1/2008 12:00:00 AM
  • Firstpage
    1038
  • Lastpage
    1046
  • Abstract
    Our RF signal-quality measurement macro employs 1) a new window-shifting measurement technique that obtains the power of a high-frequency component on the basis of lower-frequency measurements, and 2) a new stair-like weighted addition technique that decreases error due to harmonic power, phase, and DC offset in measured signals. The macro occupies only 1/10 the area of conventional on-chip spectrum analyzers. Carrier power for 2.4 GHz-Tx was successfully measured with digital testers alone, with an error of only <1 dB, and harmonic-emission exceeding FCC regulations (> -20 dBm) was also successfully detected.
  • Keywords
    circuit testing; harmonic analysis; signal processing; DC offset; RF diagnosis; RF signal quality measurement macro; RF signal-quality measurement macro; RF test; carrier power; digital testers; harmonic power; harmonic-emission; high-frequency component; lower-frequency measurements; on-chip spectrum analyzers; stair-like weighted addition; window-shifting measurement; Automatic testing; Circuit testing; Frequency measurement; Phase measurement; Power harmonic filters; Power measurement; Power system harmonics; Radio frequency; Semiconductor device measurement; System testing; Harmonic analysis; radio-frequency testing; spectrum measurement;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2008.917566
  • Filename
    4476503